10/05/2025

💻🧑‍🏫 Bridging Analog & Digital: Power of Mixed-Signal Simulation with eSim | TSW

 



What is eSim?

A free and open-source EDA tool (formerly Oscad/FreeEDA) Integrated Simulation Cockpit Built on top of tools like KiCad, Ngspice, GHDL, OpenModelica, Verilator, and more Supports the SkyWater SKY130 PDK Released under the GNU GPL license Why Attend? 🔗 Experience mixed-signal simulation where analog meets digital. 💡 Discover eSim as a powerful open-source alternative to costly EDA tools. 📡 Learn how analog signals interact with digital logic in real-world systems like SoCs, ADC/DACs, and sensor interfaces. 🎓 Perfect for students, educators, startups, and researchers to bridge theory with hands-on practice. 🛠️ What Will Be Covered? 🛠️ Introduction to eSim mixed-signal simulation environment. ⚙️ Co-simulation using Ngspice (analog) + Verilator/GHDL (digital). 📝 Design flow: 📐 Analog schematics 💻 Digital HDL (Verilog, SystemVerilog, TL-Verilog, VHDL) 🎬 Running synchronized analog–digital simulations. 🚀 Applications: ADC/DAC design, sensor interfaces, mixed-signal SoCs, embedded systems. 🔍 Insights into continuous-time vs. event-driven domain interactions. 👥 Who Should Watch?
UG/PG Electronics Engineering Students (BSc/BTech/M.Sc/MTech/MS) Faculty Members & Researchers Lab Instructors & Technical Staff Anyone seeking an open-source EDA solution Important Links :
eSim Spoken Tutorial Forum: https://forums.spoken-tutorial.org/filter/eSim/ eSim Manual: https://static.fossee.in/esim/installation-files/eSim_Manual_2.5.pdf eSim Downloads Page: https://esim.fossee.in/downloads eSim Contact Us:https://esim.fossee.in/contact-us 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472

Watch the recorded webinar here :




🎙️ Young Entrepreneur, Big Mission: Aditya Pandya & SanCorp’s Semiconductor Story | Guest- Aditya Pandya | TSP



We had an engaging session featuring Aditya Pandya, the young and dynamic Founder & CEO of SanCorp Semiconductors in our latest episode of TSP.

In this episode, we have discussed : 💡 What inspired him to step into semiconductors at such a young age 🏗️ His journey from idea to building SanCorp Semiconductors 🔬 Why silicon wafer manufacturing is both challenging and vital for India’s semiconductor roadmap 🤝 How he builds credibility and teams as a young founder in a highly experienced industry 🌍 His key takeaways from Semicon 2025 and global perceptions of young entrepreneurs in deep tech 🌱 SanCorp’s approach to sustainability in wafer manufacturing 📈 His long-term vision for SanCorp and India’s role in the global semiconductor ecosystem Stay tuned for an inspiring conversation that highlights the passion, challenges, and vision shaping India’s semiconductor future. ⚡🇮🇳 Click : https://youtube.com/live/zZ3x4MERmHM?feature=share Scan the QR . #Semiconductors #WaferManufacturing #DeepTech #IndiaSemiconductorMission #Entrepreneurship #Podcast In this podcast series, discussion on VLSI and its related fields is presented, focusing on recent developments and advancements in the industry. Topics such as the latest trends and innovations in semiconductor technology are explored, offering insights into the evolving landscape. Career guidance is shared, providing practical advice for navigating the field, along with success stories that highlight the journeys of professionals who have made their mark in VLSI. Whether for students, professionals, or those interested in the subject, valuable knowledge is offered to help stay informed and succeed in this dynamic area. Guest : Aditya Pandya Aditya Pandya is the Founder & CEO of SanCorp Semiconductors, a young and dynamic company focused on advancing India’s semiconductor ecosystem through high-quality silicon wafer manufacturing. With a strong vision to position India as a global technology leader, he combines expertise in supply chain digitalisation and strategic design to set new benchmarks in efficiency, precision, and sustainability. A young entrepreneur making waves in deep tech, Aditya represents the new generation of leaders driving innovation and resilience in the semiconductor industry. 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472


Watch the podcast episode here :





9/29/2025

🎙️Technology, Leadership & Growth: Insights from Dr. Chetna Mohan | Guest – Dr. Chetna Mohan | TSP




We had an exciting and engaging session with Dr. Chetna Mohan 👩‍💼, President of El Camino Technologies, in our latest episode ! With 28+ years at the intersection of innovation and impact, she brings unique insights into semiconductors, OSAT, RF & microwave, and solar PV 🌐⚡.

In this inspiring conversation, she has shared : ✨ Her journey from early career to leading El Camino Technologies 🌟 Defining moments that shaped her path as a technologist & leader 💡 What inspired her to step into entrepreneurship 🌏 India’s evolving role in the global semiconductor ecosystem 🔧 The rise of OSAT & semiconductor packaging in India 🤝 Collaboration between startups, corporates, academia & government 🚀 Building & scaling high-performance technology teams 🔬 Bridging R&D with real-world applications 📈 Insights from SEMICON India 2025 🎓 Advice for young professionals & freshers This episode is a must-listen for anyone passionate about innovation, leadership, and India’s semiconductor future! 💼💡 In this podcast series, discussion on VLSI and its related fields is presented, focusing on recent developments and advancements in the industry. Topics such as the latest trends and innovations in semiconductor technology are explored, offering insights into the evolving landscape. Career guidance is shared, providing practical advice for navigating the field, along with success stories that highlight the journeys of professionals who have made their mark in VLSI. Whether for students, professionals, or those interested in the subject, valuable knowledge is offered to help stay informed and succeed in this dynamic area. Guest : Dr. Chetna Mohan Dr. Chetna Mohan is an entrepreneurial technologist with over 28 years of experience at the intersection of innovation and impact. With a PhD in semiconductor packaging and skill development and an MBA from IIM Bangalore, she has worked across Europe, the U.S., and Asia—building strategic alliances, leading high-level negotiations, and representing organizations at global forums. As President of El Camino Technologies, Dr. Mohan has led the delivery of advanced technology systems for national defense while contributing to India’s growing OSAT ecosystem, strengthening the country’s semiconductor innovation and manufacturing capabilities. Her expertise spans semiconductors, RF & microwave telecommunications, and solar PV, with a focus on integrating technology, operations, and workforce development. Passionate about bridging R&D with real-world applications, Dr. Mohan is committed to fostering cross-sector collaboration and building future-ready skill ecosystems to make technology more sustainable, inclusive, and impactful. 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472

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9/16/2025

💻🧑‍🏫 MCU SoC Design with SERV Processor | RISC-V & LiteX FPGA Tutorial (RTL to Bitstream) | Presenter - Anoushka Tripathi

 



👥 Who Should Attend?

🎓 Students & Graduates curious about RISC-V, SoC design, and FPGA-based microcontrollers. 💼 Early-career professionals aiming to gain hands-on skills in RTL-to-bitstream flows using open-source tools. 🛠️ FPGA Engineers & Chip Designers exploring LiteX for automated SoC integration and deployment. 💡 Tech Enthusiasts & Makers eager to understand how the world’s smallest RISC-V CPU (SERV) works in practice. 📚 Educators & Researchers looking for practical teaching examples in open-source CPU and SoC design. 🔹 Why Attend? 🖥️ Learn RISC-V basics: the open-source CPU instruction set architecture. ⚙️ Discover SERV – the world’s smallest RISC-V CPU, ideal for MCU-class SoCs. 🛠️ Understand SoC design flows: manual RTL, vendor toolchains, and open-source frameworks. 🔗 Hands-on LiteX workflow: from Python-based SoC generation to FPGA deployment. 📟 Explore FPGA bitstream creation, UART/GPIO/Timer integration, and firmware execution. 🌍 Gain exposure to open-source collaboration, cost savings, and innovation opportunities. Guests Bio : Anoushka Tripathi is introduced as a VLSI Engineer at Monk9Tech, India’s own semiconductor fab, where FPGA-based SoC design projects are being worked on. AryavartSemi was founded by her as an initiative to spread semiconductor awareness and to build a stronger tech community in India. Her internship was undertaken at DRDO SSPL, during which contributions were made to FPGA-based defense applications, strengthening hands-on expertise in system design. A vision to drive innovation in India’s semiconductor ecosystem is carried forward, with the aim of bridging advanced chip design with real-world impact. 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472


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9/07/2025

💻🧑‍🏫 From Microcontroller to PCB: Designing an IoT Development Board | Guest - Swastik Dey | TSW




👥 Who Should Attend?

🎓 Students & Graduates exploring the world of digital logic design, RTL, and looking to build a career in VLSI and processor design. 💼 Early-career professionals eager to strengthen their Verilog and RTL simulation fundamentals. 🛠️ Engineers & Chip Designers wanting to deepen their knowledge in combinational logic and performance-driven shift operations. 💡 Tech Enthusiasts & Hobbyists interested in how efficient shift operations improve CPU and DSP speeds. 📚 Educators & Researchers seeking structured examples to teach advanced Verilog and computer architecture. 🔹 Why Attend? 📟 Basics of Microcontrollers and their role in IoT 🛠️ PCB fundamentals: layers, components, and terminologies 🔧 Key components like Atmega328p, CH340g chip, and ICSP headers ⚡ Power, communication, and programming interfaces 🖼️ Final PCB render and practical insights Guests Bio : Swastik Dey is currently pursuing his M.Tech in VLSI Design from the Institute of Radio Physics and Electronics, Calcutta University. He holds a B.Tech degree in Electronics and Communication Engineering from Techno Main Saltlake, Maulana Abdul Kalam Azad University of Technology. His academic interests include Embedded Systems, Internet of Things (IoT), and FPGA Systems, where he continues to explore innovative approaches to hardware and system design. 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472


Watch the webinar episode here :




8/31/2025

Learn and Design Semiconductors

 




🚀 Pleased to announce the launch of Learn and Design Semiconductors!

An initiative by TechSimplifiedTV to train, guide, and collaborate with learners, startups, academia, and industry — creating a flexible hub for hands-on learning, design mentorship, and custom semiconductor consulting.

What we offer : 

🎓 Education & Training :  Corporate programs, workshops, bootcamps, certifications, and academic collaborations.

🎤 Media & Outreach :  Sponsored webinars, technical storytelling, digital visibility, and video publicity.


🧩 Ecosystem & Consulting  : Startup advisory, innovation showcasing, community building, and academic–industry connect.

Our focus remains on practical learning, design thinking, and real-world industry exposure — because the future is built by those who design it.

💡 TechSimplifiedTV will continue to provide free tutorials, blogs, podcasts, and community initiatives. 

Learn and Design Semiconductors is an added step to strengthen the ecosystem through business collaborations.

Visit :  🌐 https://ldsemis.techsimplifiedtv.in/ 

Follow us in LinkedIn.









8/24/2025

🎙️ From Harihar to Deep Tech: Ananth Kulkarni on Building Hexitronics | TSP | Mr. Ananth Kulkarni




In this episode of  The Semiconductor Podcast, we sat down with Mr. Ananth Kulkarni, Founder & Managing Director of Hexitronics Automation LLP. 🚀

From building a deep-tech company in Harihar 🏭 to creating IoT solutions that power energy ⚡, agriculture 🌱, and automation 🤖, Ananth shares his entrepreneurial journey, the turning points, and his long-term vision for Industry 4.0 in India 🇮🇳.
🔑 Some of the exciting themes we have discussed :
💡 The spark behind starting Hexitronics & spotting market gaps ⚙️ Predictive maintenance explained in simple terms—why it matters today 🌐 What makes their sensor-to-cloud IoT approach stand out 🚜 How smart irrigation is transforming farming for Indian farmers 📊 The rise of Industry 4.0 in India & the role of Tier 2/3 cities in this revolution 🔥 A real-world success story where Hexitronics made a big difference In this podcast series, discussion on VLSI and its related fields is presented, focusing on recent developments and advancements in the industry. Topics such as the latest trends and innovations in semiconductor technology are explored, offering insights into the evolving landscape. Career guidance is shared, providing practical advice for navigating the field, along with success stories that highlight the journeys of professionals who have made their mark in VLSI. Whether for students, professionals, or those interested in the subject, valuable knowledge is offered to help stay informed and succeed in this dynamic area. Guest : Ananth Kulkarni An innovator and builder at heart, Mr. Ananth Kulkarni has been recognized for work at the intersection of IoT, automation, and scalable tech infrastructure. The mission to make IoT truly plug-and-play—free from code, delays, and complexity—has been pursued through the founding of NodeX and leadership at Hexitronics Automation LLP. A patent-pending IoT system enabling auto-configuration and real-time dashboards within minutes has been spearheaded under his direction. Through NodeX, device deployment has been transformed, with live dashboards auto-generated in under two minutes using only a device ID, allowing industries in energy, FMCG, HVAC, AMRs, and beyond to manage sensors seamlessly. Over the past five years, groundbreaking IoT solutions have been developed under his guidance, making sensor management simpler and real-time intelligence more accessible to businesses.
Watch the episode here:




8/16/2025

🎙️Powering ASEAN: Malaysia’s Semiconductor Vision & India Collaboration | Matthew Barsing | TSP

 



We are thrilled to welcome Matthew Barsing, a cross-border investment strategist with 20+ years of experience in FDI, bilateral trade, and digital economy policy. Currently Director & CCO at EPS Consultants and Ambassador to IT Park Uzbekistan, Matthew is also the author of Unleashing Malaysia’s Economic Potential. 📖🇲🇾

In this episode of The Semiconductor Podcast (TSP), we have explored : 💼 Matthew’s journey — from diverse global roles to shaping Malaysia’s semiconductor strategy 📚 The making of his new book & his upcoming appearance at the Delhi Book Fair 🇮🇳 🏭 Malaysia’s semiconductor evolution — balancing traditional manufacturing with AI & deep-tech 🌐 India–Malaysia collaboration — as a gateway into ASEAN markets 🤝 Government incentives & leveraging the China+1 strategy for resilient supply chains 🎯 High-potential sectors — medical devices, automotive, AI chips, advanced packaging 👩‍💻 Talent development — driving Malaysia’s AI & semiconductor workforce growth 💡 Future vision — from joint R&D to a pan-Asian alliance for fabless startups If you’re an entrepreneur, investor, or policymaker eyeing Malaysia’s growing role in the global semiconductor supply chain, this conversation is packed with insights you won’t want to miss. In this podcast series, discussion on VLSI and its related fields is presented, focusing on recent developments and advancements in the industry. Topics such as the latest trends and innovations in semiconductor technology are explored, offering insights into the evolving landscape. Career guidance is shared, providing practical advice for navigating the field, along with success stories that highlight the journeys of professionals who have made their mark in VLSI. Whether for students, professionals, or those interested in the subject, valuable knowledge is offered to help stay informed and succeed in this dynamic area. Guest : Matthew Barsing Matthew Barsing – Cross-Border Business & Tech Ecosystem Leader Matthew is a global business strategist with over two decades of experience in foreign direct investment, AI, and technology ecosystem development across Asia and emerging markets. He serves as Chief Commercial Officer at EPS Consultants, driving talent and outsourcing solutions across Southeast Asia and Japan. As Ambassador to IT Park Uzbekistan and a member of Malaysia’s National AI Office Talent Group, Matthew champions AI adoption, talent development, and cross-border tech investments. He also mentors startups with Orbit Startups and has scaled ventures like Superceed and Igoroom, leading regional expansions and AI-powered innovations. Previously, as Head of FDI at Malaysia Digital Economy Corporation, he secured RM5.37B in global projects, attracting Fortune 500 firms and transforming Malaysia’s Shared Services & Outsourcing sector. Passionate about building synergies between ASEAN, South Asia, and frontier markets, Matthew focuses on advancing semiconductors, AI, and digital infrastructure for inclusive growth. 🎙️ New to streaming or looking to level up? Check out StreamYard and get ₹740 discount! 😍 https://streamyard.com/pal/d/5468382652137472 This video also suggests: Malaysia semiconductor industry growth 2025 Malaysia role in global semiconductor supply chain India Malaysia semiconductor collaboration opportunities ASEAN market entry strategy for Indian semiconductor startups Foreign direct investment in Malaysia semiconductor sector Government incentives for semiconductor investment in Malaysia Malaysia AI and advanced semiconductor innovation Balancing electronics manufacturing with AI in Malaysia High-potential sectors in Malaysia semiconductor industry China plus one strategy for semiconductor supply chain diversification Talent development in Malaysia semiconductor and AI workforce National AI Talent Working Group Malaysia impact Cross-border partnerships in semiconductor and deep-tech Gateway to ASEAN semiconductor markets via Malaysia Malaysia–Australia trade in electronics and semiconductors Pan-Asian alliance for fabless semiconductor startups Joint R&D opportunities in ASEAN and India semiconductors Financing options for cross-border hardware startups in Asia Book on Malaysia economic potential by Matthew Barsing Delhi Book Fair 2025 featured author Matthew Barsing


Watch the podcast here :





What is Testing in VLSI ?


In this article we dive deep into the world of VLSI Testing and understand why it plays a crucial role in semiconductor manufacturing. Learn about the different test stages, the importance of fault coverage, and how yield and reject rates impact product quality. We explain test philosophies, verification testing, and the critical steps involved in post-fabrication chip debugging. Discover how manufacturing tests, testers, and test fixtures are used to ensure reliable product delivery while keeping cost considerations in mind. The video also covers silicon debugging, handling silicon failures, and the concept of Design for Manufacturability (DFM) to optimize chip performance and profitability. Perfect for students, engineers, and semiconductor enthusiasts!


Why VLSI Testing is Important?

Integrated Circuit (IC) or VLSI Testing includes procedures that is followed post fabrication in order to detect possible manufacturing defects. Testing is required to guarantee fault-free products A reliable product with small time to market will provide higher revenues than a second product with a greater time to market. Testing procedures at the minimum cost in time and resources are required!

Testing Necessity :

- Imperfections in fabrication process may lead to manufacturing defects.

- The manufacturing yield (Y) depends on used technology, silicon area and layout design.

- Decreasing feature size increases probability of defects during fabrication

- A single faulty transistor or wire results in faulty IC.

Why does a product fail test?

If a designed product fails in  testing the probable reason might be any of the below :

(1) wrong testing procedure ,

(2) faulty fabrication process ,

(3) incorrect design , 

(4) faulty specification

The role of testing is to detect and determine exactly what went wrong. Correctness and effectiveness of testing is most important for quality products.



Testing is applying set of test stimuli to inputs of CUT and  analyzing output responses.

(1) Incorrect O/P, CUT is faulty [FAIL]

(2) Correct O/P, CUT is fault-free [PASS]

VLSI Test Stages :


1. Verification testing, characterization testing and debug design : Verifies correctness of design and test procedure.

2. Manufacturing testing : Factory testing of all manufactured chips for parametric faults and for random defects.

3. Burn-in: Testing for reliability

4. Acceptance testing /incoming inspection : Customer performs tests on purchased parts to ensure quality.

Role of testing :

1. Detection: Go/no-go, is the chip fault-free/faulty. Must be fast.

2. Diagnosis: Determines whether the chip is faulty and investigate the reason of fault. Performed on chips that fail at detection level.

3. Device characterization: Determines and corrects error in design and/or test procedure.

4. Failure Analysis : Determines the manufacturing process errors that may have caused defects on the chip.


Yield , Reject Rate & Fault Coverage :



The yield of a manufacturing process is :

Two types of yield loss: Catastrophic and Parametric.

Catastrophic yield loss occurs is due to random defects and Parametric yield loss is due to process variations.

Inefficient testing may lead to undesirable situations like :

1. A faulty device appears to be a good part passing the test.

2. A good device fails the test and appears as faulty.



The reject rate provides an indication of the overall quality of the VLSI testing process.

Reject rate is also called Defect level.



Fault coverage of 100% is impossible because of the existence of undetectable faults. An undetectable fault means there is no test to distinguish the fault-free circuit from a faulty circuit containing that fault. Fault coverage can be modified and expressed as the fault detection efficiency or effective fault coverage:



Defect level = 1− yield^(1−fault coverage)

Test Philosophy :

Ideal Tests : Ideally detect all defects produced in a manufacturing process. Pass all functionally good chips, fail all defective chips. Large numbers and varieties of possible defects need to be tested. Difficult to generate tests for some real defects.

Real Tests : In reality due to design complexity of modern chip it is difficult to generate tests that detect every possible fault. Real Tests are based on analyzable fault models. Real Tests may not map to real defects. Some good chips are rejected and some bad chips are shipped.

Categories of Tests :

There are three main categories of test : 

1. Logic Verification (Pre-Tapeout) : Ensures the circuit functions as intended. Performed before fabrication using simulations. Identifies logic bugs early.

2. Silicon Debug (Post-Fabrication): First batch of chips tested for functional correctness Helps debug issues at full system speed. Example: Testing a new processor on a prototype motherboard

3. Manufacturing Tests (Production) : Ensures every transistor, gate, storage element works. Conducted before shipping to customers . Identifies manufacturing defects .

Earlier detection means Lower cost . Testing must be thorough and proactive.  Early detection of fault is very economical in IC design and manufacturing. A die/chip can be tested at different levels and we move forward testing cost increases.

Wafer Level : Detect defects early to reduce cost

Packaged Chip Level : Verify chip after packaging

Board Level : Test chips assembled on PCB

System Level : Check integration with other components

Field Level : Detect failures after deployment








Real-World Example:

Intel Pentium Bug (1994). A logic bug in the floating point divider went undetected 4 million faulty chips were shipped $450 million loss due to recall & reputation damage.

Most first-time silicon failures are due to design functionality issues. Testing must be planned early to,avoid costly mistakes. Debugging becomes harder post- fabrication due to limited visibility . Effective test strategies reduce cost & improve reliability.

Verification Testing in VLSI:

1.Verification Tests in the Design Process: Verification tests are usually the first ones a designer constructs. They check fundamental functionality, such as "Does the adder add?" or "Does the counter count?"

2. Equivalence Checking in Verification : Verification ensures that a synthesized gate-level description is functionally equivalent to the RTL. The goal is to also confirm that RTL aligns with the higher-level design specification.

3. The behavioral specification: The behavioral specification can be a verbal or textual description, a high-level language (C, SystemC, etc.), a hardware description language (VHDL, Verilog), a table of expected inputs and outputs, a golden model is often created as a reference for verification.

4. Functional equivalence : This step involve running simulations at different abstraction levels and comparing  outputs at key checkpoints.

5. Test Benches in HDL Verification : Test benches are used to automate stimulus generation and output checking. Verification can be done cycle-by-cycle for detailed checking. Increasingly, real-time or near real- time FPGA emulation is used. It allows testing in the actual system environment. Essential for complex chips and real-world interactions (e.g., wireless LAN chips). Helps model unpredictable effects like interference.

6. Simulation at Various Levels of the Design Hierarchy :

Functional equivalence can be verified at multiple levels.  RTLlevel allows system-level behavior testing. Gate-level and transistor-level testing is more challenging due to long simulation times. Hierarchical verification starts with small modules and verify them separately. Use modular interfaces to ensure system-level functionality. A well-structured verification hierarchy increase the chance of first-time functional success.

7. Best Practices for Functional Testing : Simulate real-world usage as closely as possible. Move up the simulation hierarchy as modules are verified. Replace lower/gate-level models with higher-level functional models when verified. Surround top-level models with a real-world software env. for testing. If time permits, functional tests should be applied at all levels, including gate and transistor levels. 

8. Advantages of FPGA-Based Emulation Over Simulation : Faster execution, often near real-time. Allows interfacing withactual analog signals. Provides finer observation and monitoring compared to final chip implementation.

Post-Fabrication Testing & Debugging :

When a chip returns from fabrication, initial tests are conducted in a lab environment.

Test Setup Requirement : A circuit board with, variable VDD with power measurement , signal connections such as analog/digital I/O as needed, stable variable-frequency clock, serial, parallel, or PCI for data exchange.

Software and Debugging : Develop software to interface with the chip via UART, serial, or bus. Essential functions include register read/write. Logic analyzer connections can also aid in debugging.

Initial Tests :

1. Smoke Test: Gradually increase VDD while monitoring current. Static circuits should show no current; analog circuits will show quiescent current.

2. Clock and Register Check: Enable the clock at a reduced speed and verify register integrity using PC-based software.

3. Logic Analyzer Tests: Download test patterns from the verification test bench.

If a chip has a BIST, commercial software or manual bottom-up approach is used for automated validation.

Debugging Strategies:

- Keep a logbook of all tests.

- Change one variable at a time and document results.

- Double-check all connections and measurements.

- Verify chip I/O and continuity.

- Consider environmental factors(temperature effects)

- Compare internal registers to documentation.

- Check timing constraints (setup/hold times).

- Look for similar issues elsewhere.

General Debugging Rules (Agans’ Methodology) :

1. Understand the system.

2. Make it fail reproducibly.

3. Observe, don’t assume.

4. Use divide-and-conquer debugging.

5. Change one thing at a time.

6. Document everything.

7. Check the entire test setup.

8. Get a fresh perspective.

9. Verify fixes—problems don’t solve themselves.


Performance Testing :

Once functionality is confirmed, evaluate performance metrics like power, speed, and analog characteristics. Store test results digitally for documentation and collaboration.

Common Chip Issues & Fixes :

1. Slower than expected: Reduce clock speed /increase VDD.

2. Race conditions: Apply heat to identify temperature sensitivity.

3. Dynamic logic failures: Redesign logic.

4. Crosstalk problems: Improve tools and layout.

5.  Incorrect functionality: Strengthen verification.

For analog circuits, factors like noise and process variations may impact performance. However, systematic debugging remains the key to resolving issues efficiently.


Manufacturing Tests:

Manufacturing tests ensure that every gate functions correctly, addressing potential defects that may arise during chip fabrication or accelerated life testing (stress testing under high voltage and temperature conditions).

Common Defects:

- Layer-to-layer shorts (e.g., metal-to-metal)

- Discontinuous wires (e.g., due to vertical topology)

- Missing/damaged vias

- Gate oxide shorts to substrate/well

Resulting Circuit Faults :

- Nodes shorted to power or ground

- Nodes shorted to each other

- Floating inputs / Disconnected outputs

Testing Strategy : Confirm gate/register functionality and detect manufacturing faults 

1. Wafer-level Testing: Early detection to avoid packaging bad dies

2. Post-Packaging Testing: Cost-effective if yield is high and packaging is cheap

Test Strategy Based on Economics :

- High Yield + Low-Cost Package (e.g., plastic): → Test after packaging

- Low Yield + High-Cost Package (e.g., ceramic): → Test at wafer level to reduce waste

 I/O Integrity Tests :

- Check I/O levels (i.e. TTL, ECL, CMOS noise margins) ,

- Speed tests for signal timing compliance

Efficiency Enhancements : Use on-chip test structures for full-speed wafer testing, Minimizes required pin connections and reduces fixture cost

Test Assumption : Assumes chip functionality is correct , Focuses on exercising all gate inputs and observing all outputs.


Testing of a Chip:



Tester &  Test Fixtures : 

What is a Tester :

 A tester applies a sequence of electrical stimuli to a chip or system under test (SUT). Monitors and records the results to detect faults. Available in various forms depending on the test environment and chip type.

Types of Test Fixtures:

1. Probe Card – For wafer-level or bare-die testing

2. Load Board – For packaged chip testing

3. Bench PCB – For manual/automated lab testing

4. In-System PCB – Tests chip in its real-world application context

Production testers :

- These are are high-end, general-purpose systems used for chip testing. They feature configurable I/O ports(drive current, voltage levels) and large RAM per pin. Inputs are driven and outputs

- These testers are expensive and essential for high-precision with high-throughput production testing, high-end configurable systems with cycle-by-cycle control , ability of driving input/output pins with precise voltage, timing and equipped with test memory, advanced diagnostic capabilities

Test setup :

Drive-electronics Cabinet , Controlling Workstation , Test Head (where the DUT is placed via a load board) 

Production Testing & Cost Considerations:


Test Execution Process:

Test program compiled and downloaded into the tester DUT (chip) placed on probe card/load board Inputs applied, outputs sampled, results compared Faulty chips marked (e.g., ink dot) and sorted. Automated handling repeats the cycle efficiently

Advanced Testing – Shmoo Plots :

Vary voltage (e.g., 3V–6V on a 5V part) and timing.  Reveal chip performance sensitivity across conditions Useful for analyzing setup/hold time margins and voltage tolerance

Cost & Efficiency Factors:

- High-frequency or analog/RF testing is expensive

- Time-based billing: shorter tests = lower costs

- Trade-off between test coverage and cost

- Lab testers offer a low-cost alternative with reduced

capabilities

Test Program : 

The tester operates based on a test program, typically written in a high-level language tailored to the tester (e.g., with built-in primitives). This program defines input patterns and expected output assertions. If the observed outputs deviate from the expected values at the specified times, the tester flags an error. Before running the tests, the program configures essential tester attributes, including:

- Setting supply voltages

- Mapping signal names to physical tester pins

- Defining pin directions (input/output) and VOH/VIH levels

- Configuring the tester clock

- Establishing pattern and assertion timing

For each chip tested, following steps are performed:

- Apply supply voltages

- Send digital stimuli and capture responses

- Compare responses to expected value

- Log and report any discrepancies


Silicon Debugging & Silicon Failure :






Silicon Debugging : Challenging when a root cause of chip malfunctions is unclear from pin/scan chain measurements.

Several techniques enable direct access to the silicon:

1. Probe Points: Small metal pads (5–10 µm) on the chip surface allow direct probing of key circuit nodes using fine-tipped probes under a microscope.

2. Electron Beam & Laser Voltage Probing: E-beam probes use scanning electron microscopes to measure on-chip voltages, while Laser Voltage Probing analyzes modulated light reflections to deduce switching wave forms. Picosecond Imaging Circuit Analysis captures light emissions from switching transistors.

3. Infrared Imaging & Liquid Crystal Techniques: IR imaging helps detect "hot spots" caused by resistive shorts, while liquid crystal coatings can reveal temperature variations. 

4. Focused Ion Beam (FIB) & Laser Cutting: FIB can modify circuit connections by cutting or depositing metal, offering faster debugging than mask changes. 


Silicon Failure :

Silicon failures fall into three categories:

1. Manufacturing failures stem from defects or parametric deviations. Debugging can help reject bad chips or refine designs for better yield.

2. Functional failures arise from logic bugs or physical design flaws, typically fixed by improving verification.

3. Electrical failures occur when a logically correct chip malfunctions under specific conditions like voltage, temperature, or frequency.



Shmoo Plot :

Shmoo plots aid in debugging electrical failures by mapping test results across voltage and frequency ranges. A well functioning chip should operate at higher speeds as voltage increases. Variations in shmoo patterns can reveal underlying issues such as charge sharing, race conditions, leakage problems, and coupling noise. Temperature based shmoo plots can also highlight failure modes.

Design for Manufacturability :

Circuits can be optimized for manufacturability to increase their yield. This can be done in a number of different ways.

1. Physical Design Optimization :

Increase wire spacing to reduce short-circuit risks , Enhance layer overlap around contacts/vias to minimize misalignment issues , Use multiple vias at intersections to prevent open circuits, Modern EDA tools increasingly automate these improvements.

2. Redundancy :

Include spare memory rows/banks to replace defective units. Laser-cut fuses or programmable fuses enable reconfiguration post-test . Faulty memory banks can be disabled via software

3. Power Management :

High power can lead to metal migration and thermal degradation. Use of low-power design techniques, efficient packaging, and heat sinks to manage thermal load 

4. Process Variation Handling:

Simulate across process corners. Use Monte Carlo analysis to account for statistical process spread and optimize design centering

5. Yield Analysis:

Analyze failed dies to identify recurring structural issues, Redesign critical layout areas (e.g., wider polysilicon or metal strapping) to improve yield.



Watch the video lecture here :